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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)


Huge Savings Item! Save 14% on the CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) by Pavlov Andrei Sachdev Manoj at EMS Linux. Hurry! Limited time offer. Offer valid only while supplies last. The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design


Product Description

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Additional Information

Manufacturer:Springer
Brand:Pavlov Andrei Sachdev Manoj
Publisher:Springer
Studio:Springer
EAN:9781402083624
Item Weight:1.04 pounds
Item Size:0.5 x 9.21 x 9.21 inches
Package Weight:1 pounds
Package Size:6.3 x 0.8 x 0.8 inches

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) by Pavlov Andrei Sachdev Manoj

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Brand: Pavlov Andrei Sachdev Manoj
4.6 out of 5 stars with 45 reviews
Condition: New
Lead Time: 1 - 2 Business Days
Availability: In Stock
$179.99
$155.25
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